2D/3D Wafer Metrology System
Candidate for：EE Awards - Test & Measurement
The 7980 wafer measurement system utilizes White Light Interferometry (WLI) for fast, non-destructive, and nanoscale 3D surface profiling, making it ideal for advanced semiconductor packaging. As of 2019, WLI held around 42% market share in the electronics and semiconductor industries, highlighting its importance in precision metrology.
The 7980 is designed for accurate 2D/3D critical dimension and probe mark measurements. Its self-monitoring QCM function ensures stable and reliable performance. With cutting-edge technology and strong adaptability, the 7980 not only meets current industry demands but is also ready for future high-precision measurement challenges.
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