EE Awards / Test Research, Inc. (TRI) / TR8100 SII - High-Pin-Count In-Circuit Tester
Test Research, Inc. (TRI)
Company Website
TR8100 SII - High-Pin-Count In-Circuit Tester
Candidate for:EE Awards - Test & Measurement
The rise of AI and the growing demand for data centers have significantly increased the need for advanced AI server boards. TRI is proud to be an integral part of the AI manufacturing ecosystem. To meet the evolving needs of the Telecom electronics manufacturing industry, the TR8100 SII Series offers a high-pin-count ICT + FCT solution with up to 11,088 test points designed to handle large, complex PCBA boards with ease and precision.

The TR8100 SII represents a significant advancement over its predecessor, increasing the maximum test point count from 5,632 to an industry-leading 11,088. This expanded capacity meets the demands of modern high-density PCBA designs. The system also introduces external power sources from 6 to 12, increased fixture capacity from 100 to 360Kg, and enhanced low-voltage testing through independent per-pin architecture. These improvements enhance efficiency, adaptability, and fault detection reliability. The system accommodates various board sizes and testing requirements, supporting multiple industry standards, including AI servers, 5G, and AIoT boards. Its modular structure allows easy upgrades and expansions.

TR8100 SII integrates seamlessly with existing manufacturing systems, ensuring compatibility with legacy TRI modules (SMB, TCM, DUT-PWR, and APPS), fixtures, and test programs. This reduces the need for costly replacements, minimizes downtime, and accelerates deployment, making it a cost-effective choice.

The TR8100 SII supports Industry 4.0 initiatives such as IPC-CFX and IPC-HERMES. The ICT also promotes traceability by generating SPC reports and interconnecting with MES systems.

With high fault coverage, advanced test capabilities, and support for boundary scan testing, the system delivers exceptional performance for testing complex, large, and low-voltage devices.

The TR8100 SII's non-multiplexing 1:1 per-pin architecture accelerates test speeds. The vacuum fixture ensures rapid and precise board handling for high-throughput production environments.

The TR8100 SII's UI features cosmetic updates to enhance user experience and visual clarity while retaining the familiar structure of its predecessors. These updates enable operators to adapt quickly and simplify program development for engineers.
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